RF Circuit Designs for Reliability and Process Variability Resilience
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Announcing the Final Examination of Ekavut Kritchanchai for the degree of Doctor of Philosophy Time & Location: March 2, 2016 at 1:00 PM in HEC 450 Title: RF CIRCUIT DESIGNS FOR RELIABILITY AND PROCESS VARIABILITY RESILIENCE
Complementary metal oxide semiconductor (CMOS) radio frequency (RF) circuit design has been an ever-lasting research field. It has gained so much attention since RF circuits offer high mobility and wide-band efficiency, while CMOS technology provides the advantage of low cost and high integration capability. At the same time, CMOS device size continues to scale to the nanometer regime. Reliabil...
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تاریخ انتشار 2016